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 Reliability Test of Transistor 

Test Item Test Method
MIL-STD
Condition Samples
Size
ACC/
REJ No.
Frequency/
Report
1. Temp. Cycle (T/C) (1) MIL-STD-883D 1010.COND.C
(2) JIS C7021 A-4
-65XC(30min.)25XC(5min.)+150XC(30min.), 50 Cycles 22 0/1 Once/Month
2. High Temp. Storage (HTS) (1) MIL-STD-750 1031
(2) JIS C7021 B-10
Ta=150XC
168/500/1000 Hours
22 0/1 Once/Month
3. Low Temp. Storage (LTS) JIS C7021 B-12 Ta=-50XC
168/500/1000 Hours
22 0/1 Require of Customer
4. Moisture Resistance (M/R) (1) MIL-STD-7501021
(2) JIS C7021 B-11-C
Ta=85XC, RH=85%
168/500/1000 Hours
22 0/1 Once/Month
5.Pressure Cooker Test (PCT) EIAJ-IC-121 Ta=121XC2XC
RH=100%, 15PSIG
168 Hours
22 0/1 Once/Month
6. Operating Life Test (OPL) JIS C7021 B-4 Ta=25XC,*max
168/500/1000 Hours
0.7* VCEO
22 0/1 Once/Month
7. High Temp. Reverse Bias (HTRB) JIS C7021 B-8 Ta=150XC
168/500/1000
HoursVCB max*0.8
22 0/1 Once/Month
8. Thermal Shock (1) MIL-STD-883D 1011.COND.A
(2) JIS C7021 A-3
Ta=0XC/+100XC
T=5min/5min
5 Cycles
22 0/1 Require of Customer
9. Solderability Test (S/T) 883-2003 Ta=245XC5XC (HTH)
Ta=215XC5XC (SMT)
T=50.5sec
Cover Area>90%
22 0/1 Once/Month



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